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#01

仅人工智能

Rapid deployment of UnitX AI for defect detection with existing imaging systems.
UnitX AI can integrate with:
  • Traditional third party vision systems to provide superior defect detection faster where you already have vision systems employed.
  • X-Ray / CT scanners to detect internal defects not apparent on the surface, such as foreign particles or internal structural defects
  • Specialized semiconductor optical inspection equipment to detect and classify wafer fabrication defects
#02

人工智能+成像

采用UnitX成像与人工智能技术的顶级视觉检测系统
#03

一站式检测解决方案

Turnkey AI inspection for any inspection application– no matter how complex
Includes inspection applications where:
  • The UnitX system is fixed on the production line
  • The UnitX system provides 360° inspection for complex geometries with 6 DOF motion

仅人工智能

能够集成于现有成像系统的小样本量人工智能系统

人工智能+成像

采用UnitX成像与人工智能技术的顶级视觉检测系统

一站式检测解决方案

适用于高速生产线的一站式在线检测设备

Architecture